Atomic force microscope
Description
Model: Keysight 5500 AFM/SPMThe atomic force microscope (AFM) / scanning probe microscope (SPM) images and measures materials at the nanoscale.Due to funding some restrictions may apply to the use of this item. For further details please contact Mark Rushforth or Sara Baldock.
ManufacturerJOEL
Model
Location
Lancaster University Campus
Contact
Academic Contact
| Dr Sara Baldock | |
| s.baldock@lancaster.ac.uk | |
| +44 1524 595164 |
Technical Contact
| Dr Sara Baldock | |
| s.baldock@lancaster.ac.uk | |
| +44 1524 595164 |