Microscope - S3400N VP SEM
Description
High voltage and 3000 times high resolution. Electrons from tungsten filament interact with the sample to give an image of the surface.
ManufacturerHITACHI
ModelS3400N II
Location
University of Leeds (Identifier: 1)
Contact
Academic Contact
| Prof Prof Jennifer Kirkham | |
| j.kirkham@leeds.ac.uk | |
| +44-113-34-36156 |
Technical Contact
| Mrs Mrs Jacqueline Hudson | |
| j.hudson@leeds.ac.uk | |
| +44-113-34-36160 |