SEM (FEI, Nova NanoSEM)
Description
Scanning electron microscope EDX chemic elemental analysis. It is used for conductive and non-conductive samples. Working resolution is 1 nanometer.
ManufacturerFEI
ModelNOVA NANOSEM
Location
University of Leeds (Identifier: 1)
Contact
Academic Contact
| Prof Prof Fiona Meldrum | |
| f.meldrum@leeds.ac.uk | |
| +44-113-34-36414 |
Technical Contact
| Dr Dr Alexander Kulak | |
| a.kulak@leeds.ac.uk | |
| +44-113-34-38972 |