X-Ray Camera Siemans
Description
An X-ray diffractometer dedicated for thin film low angle X-ray reflectometry measurements for thin film deposition rate and surface characterisation. This system has largely been superseded by the Bruker D8 Discovery system for higher end applications.
ManufacturerSIEMENS
ModelPX8636/8637
Location
University of Leeds (Identifier: 1)
Contact
Academic Contact
| Prof Prof Bryan Hickey | |
| b.j.hickey@leeds.ac.uk | |
| +44-113-34-33836 |
Technical Contact
| Dr Dr Mannan Ali | |
| phyma@leeds.ac.uk | |
| +44-113-34-33833 |