Description

An X-ray diffractometer dedicated for thin film low angle X-ray reflectometry measurements for thin film deposition rate and surface characterisation. This system has largely been superseded by the Bruker D8 Discovery system for higher end applications.

ManufacturerSIEMENS

ModelPX8636/8637

Contact

Academic Contact

Prof Prof Bryan Hickey
b.j.hickey@leeds.ac.uk
+44-113-34-33836

Technical Contact

Dr Dr Mannan Ali
phyma@leeds.ac.uk
+44-113-34-33833