Digital Instruments/VEECO - Nanoscope IIIA

 

Description

Microscope AFM (VEECO) - A Digital Instruments (VEECO) Nanscope IIIA AFM is used to record in-air or in-liquid AFM (Atomic Force Microscopy) images of mineral surface structure (z resolution sub angstrom x,y resolution 1-5 angstroms) in contact or tappi. Facility: Williamson Research Centre

ManufacturerDIGITAL INSTRUMENTS/VEECO

ModelNanoscope IIIa

Contact

Academic Contact

Professor Jonathan Lloyd
Jon.Lloyd@manchester.ac.uk
+44-161-275-7155

Technical Contact

Dr Paul Wincott
paul.wincott@manchester.ac.uk