Digital Instruments/VEECO - Nanoscope IIIA
Description
Microscope AFM (VEECO) - A Digital Instruments (VEECO) Nanscope IIIA AFM is used to record in-air or in-liquid AFM (Atomic Force Microscopy) images of mineral surface structure (z resolution sub angstrom x,y resolution 1-5 angstroms) in contact or tappi. Facility: Williamson Research Centre
ManufacturerDIGITAL INSTRUMENTS/VEECO
ModelNanoscope IIIa
Location
Main Campus
Contact
Academic Contact
| Professor Ian Lyon | |
| Ian.Lyon@manchester.ac.uk | |
| +44-161-275-3942 |
Technical Contact
| Dr John Cowpe | |
| john.cowpe@manchester.ac.uk | |
| +44-161-275-0384 |