Ion Beam Scanning Electron Microscope
Description
FEI Nova 200 NanoLab high resolution Field Emission Gun Scanning Electron Microscope (FEGSEM) with precise Focused Ion Beam(FIB) etching and (Pt) deposition capabilities for in-situ TEM sample preparation (Kleindieck nanomanipulator) and Ion beam Lithography.
ManufacturerFEI
ModelNOVA 200
Components
Location
University of Leeds (Identifier: 1)
Contact
Academic Contact
| Prof Prof Richard Drummond-Brydson | |
| r.m.drummond-brydson@leeds.ac.uk | |
| +44-113-34-32369 |
Technical Contact
| Mr Mr John Harrington | |
| j.p.harrington@leeds.ac.uk | |
| +44-113-34-32559 |