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Transmission electron Microscope (tomog)
Tri-Pin 1
Materials Characterisation
Mechanical Properties
Tribometer
Tri-Pin 2
Materials Characterisation
Mechanical Properties
Tribometer
Triple Quadrupole Mass Spectrometer
Materials Characterisation
Spectrometry
Mass Spectrometry
TruFade Xenon Arc Light Fastness Tester
Tui Laser - PLD Workstation
Process Equipment - Physical
Thin Film Deposition
Pulsed Laser Deposition
Tuneable Nanosecond Laser
Tuneable Nanosecond Laser
Turbiscan Lab Expert
Materials Characterisation
Physical Properties
Particle Size Analysis
TVS Hardware Upgrade
Two Channel Auditory Evoked Potential
UHPLC
UHV Chamber for Low Temp Surface Science
Materials Characterisation
Surface analysis
Adsorption
Ultra Precision Measurement System
Process Equipment - Physical
Characterisation
Profilometer
Ultracentrifuge
Ultracentrifuge
Ultrafast Laser Plasma Deposition System
Ultrasizer
Materials Characterisation
Physical Properties
Particle Size Analysis
Ultrasizer MSV
Materials Characterisation
Physical Properties
Particle Size Analysis
Ultrasound Velocimeter
Sample Measurement/Analysis
Motion
Fluid
Unistat 162W
Process Equipment - Physical
Chemical Reactor
Automated Synthesis
Unisteel 1
Materials Characterisation
Mechanical Properties
Tribometer
Unisteel 2
Materials Characterisation
Mechanical Properties
Tribometer
Uniterrupted Power supply (UPS)
Universal Testing Machine
Materials Characterisation
Mechanical Properties
Load
Upgrade E-Gun
Process Equipment - Physical
Thin Film Deposition
Molecular Beam Epitaxy
UV-3101 Spec System
Materials Characterisation
Spectrometry
Spectrophotometry
V03VNA-T/R 220-325 GHz TRANSMISSION
Sample Measurement/Analysis
Electronic
Network Analyser
V05VNA-T/R 140-220 GHz TRANSMISSION
Sample Measurement/Analysis
Electronic
Network Analyser
V06VNA-T/R 110-170 GHz TRANSMISSION
Sample Measurement/Analysis
Electronic
Network Analyser
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