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Auto Freeze substitution
Materials Characterisation
Electron/Ion Microscopy
Transmission
Auto Freeze substitution
Materials Characterisation
Electron/Ion Microscopy
Transmission
Benchtop Scanning electron microscope (SEM) (MAN-E-BIO-11b)
Materials Characterisation
Electron/Ion Microscopy
Scanning
Bi-Cam Scan
Materials Characterisation
Electron/Ion Microscopy
Scanning
CRYOELECTRON Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning Transmission
Desktop Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Desktop Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Dionex Integrion HPIC system
Materials Characterisation
Electron/Ion Microscopy
Sample Manipulation
Dionex Integrion HPIC system
Materials Characterisation
Electron/Ion Microscopy
Sample Manipulation
EDX System
Materials Characterisation
Electron/Ion Microscopy
Detectors
Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning Transmission
Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning Transmission
Electron Scanning Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning Transmission
Electronic system
Materials Characterisation
Electron/Ion Microscopy
Scanning
Environmental Cell
Materials Characterisation
Electron/Ion Microscopy
Sample Manipulation
Field Emission Scanning Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Field Emission Scanning Electron Microscope (FESEM)
Materials Characterisation
Electron/Ion Microscopy
Scanning
Field-Emission Gun SEM (FEGSEM), with an in-situ stage (MAN-E-MS4DE-10a)
Materials Characterisation
Electron/Ion Microscopy
Scanning
Gatan Cryo Holder
Materials Characterisation
Electron/Ion Microscopy
Transmission
Gatan Double Tilt Holder
Materials Characterisation
Electron/Ion Microscopy
Transmission
Gatan Tilt Rotate Cryo Holder
Materials Characterisation
Electron/Ion Microscopy
Transmission
HAADF STEM Detector
Materials Characterisation
Electron/Ion Microscopy
Scanning Transmission
Helios NanoLab 660
Materials Characterisation
Electron/Ion Microscopy
Ion Beam
Hitachi High-Technologies Quantax 70
Materials Characterisation
Electron/Ion Microscopy
Scanning
K2 Summit Counting Direct Detection Camera
Materials Characterisation
Electron/Ion Microscopy
Detectors
Leo
Materials Characterisation
Electron/Ion Microscopy
Scanning
LEO 1530 FEG Scanning Electron Microsope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
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