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4Probe STM
Sample Measurement/Analysis
Cryogenic
4K
Materials Characterisation
Electron/Ion Microscopy
Scanning
Materials Characterisation
Surface Probe Microscopy
Scanning Tunneling
Materials Characterisation
Surface Probe Microscopy
Magnetic Force
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Axon GenePix 4400A Scanner
Materials Characterisation
Electron/Ion Microscopy
Scanning
AZtec Energy Advanced EDS Analysis system
Materials Characterisation
Electron/Ion Microscopy
Scanning
CAMERA
Materials Characterisation
Electron/Ion Microscopy
Transmission
Carl Zeiss EVO MA15 VP-SEM
Materials Characterisation
Electron/Ion Microscopy
Scanning
Carl Zeiss ULTRA Plus Field Emission Scanning Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
CCD camera
Materials Characterisation
Electron/Ion Microscopy
Transmission
Confocal Microscope
Materials Characterisation
Electron/Ion Microscopy
Transmission
Cryotransfer holder with pump
Materials Characterisation
Electron/Ion Microscopy
Sample Manipulation
Cryotransfer Holder with pump
Materials Characterisation
Electron/Ion Microscopy
Sample Manipulation
Deconvolution Microscope
Materials Characterisation
Electron/Ion Microscopy
Transmission
EDX Microanalysis System
Materials Characterisation
Electron/Ion Microscopy
Transmission
Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Electron Microscopy (EM) Research Services
Materials Characterisation
Electron/Ion Microscopy
Scanning Transmission
Electron Probe MicroAnalyser
Materials Characterisation
Electron/Ion Microscopy
Scanning
Electronic Energy Filter Capillary Elect
Materials Characterisation
Electron/Ion Microscopy
Transmission
Escalab250 system inc electron gun
Materials Characterisation
Spectroscopy
Optical
Materials Characterisation
Electron/Ion Microscopy
Scanning
Materials Characterisation
Spectroscopy
X-ray Photoemission
Materials Characterisation
Spectroscopy
Auger
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FEG Analytical TEM (Talos F200A )
Materials Characterisation
Electron/Ion Microscopy
Ion Beam
FEI Double Tilt Holder
Materials Characterisation
Electron/Ion Microscopy
Transmission
FEI Magellan 400SEM and Analysis System
Materials Characterisation
Electron/Ion Microscopy
Scanning
FEI Polara 300kV FEG transmission electron microscope with postcolumn energy filter
Materials Characterisation
Electron/Ion Microscopy
Transmission
FEI Tecnai G2 20 S-Twin
Materials Characterisation
Electron/Ion Microscopy
Transmission
FEI Tecnai TEM Machine
Materials Characterisation
Electron/Ion Microscopy
Transmission
FEI Titan ChemiSTEM P
Materials Characterisation
Electron/Ion Microscopy
Transmission
Field Ion Beam Scanning Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Gatan 3 View Imaging Systems
Materials Characterisation
Electron/Ion Microscopy
Transmission
Gatan Camera
Materials Characterisation
Electron/Ion Microscopy
Transmission
Gatan Precision Etching Coating System (PECS)
Materials Characterisation
Electron/Ion Microscopy
Sample Manipulation
HKL Premium Nordlys EBSD System
Materials Characterisation
Electron/Ion Microscopy
Scanning
Illumina iScan
Materials Characterisation
Electron/Ion Microscopy
Scanning
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