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Scanning Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Scanning Electron Microscope Tescan
Materials Characterisation
Electron/Ion Microscopy
Scanning
SEC Malls
Materials Characterisation
Electron/Ion Microscopy
Sample Manipulation
SEM (FEI, Nova NanoSEM)
Materials Characterisation
Electron/Ion Microscopy
Scanning
SEM (Jeol Neoscope JCM-5000)
Materials Characterisation
Electron/Ion Microscopy
Scanning
SEM (JEOL, 6610LV)
Materials Characterisation
Electron/Ion Microscopy
Scanning
Single tilt heating holder Analytical
Materials Characterisation
Electron/Ion Microscopy
Transmission
Spinning Disc Confocal Microscope System
Materials Characterisation
Electron/Ion Microscopy
Transmission
Tecnai F30 TEM
Materials Characterisation
Electron/Ion Microscopy
Transmission
Temperature controller
Materials Characterisation
Electron/Ion Microscopy
Sample Manipulation
Temperature controller
Materials Characterisation
Electron/Ion Microscopy
Sample Manipulation
Tensile Module
Materials Characterisation
Electron/Ion Microscopy
Scanning
TESCAN MIRA3 GMU VP Analytical FESEM
Materials Characterisation
Electron/Ion Microscopy
Scanning
Tescan Vega 3 LMU Scanning Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
TIRF Confocal Microscope
Materials Characterisation
Electron/Ion Microscopy
Transmission
Topcon SM300 SEM
Materials Characterisation
Electron/Ion Microscopy
Scanning
Transmission Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Transmission
Transmission Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Transmission
Ussing 6 Chamber System
Materials Characterisation
Electron/Ion Microscopy
Transmission
Vion Plasma DualBeam FIB-SEM
Materials Characterisation
Electron/Ion Microscopy
Ion Beam
VT SPM
Materials Characterisation
Electron/Ion Microscopy
Scanning
X-Max 80/INCA to AZTEC upgrade
Materials Characterisation
Electron/Ion Microscopy
Scanning
X-ray detector and EBSD Camera
Materials Characterisation
Electron/Ion Microscopy
Scanning
XuM system move from Quanta 250 to Quanta 3D
Materials Characterisation
Electron/Ion Microscopy
Scanning
Zeiss Merlin FESEM
Materials Characterisation
Electron/Ion Microscopy
Scanning
Zeiss Sigma HD VP FESEM
Materials Characterisation
Electron/Ion Microscopy
Scanning
300kv Field emission gun transmission electron microscope dedicated for cryo-electron microscopy. The microscope has a 6 cryo-cartridge loading system and is equip with a 4k x4k Ultrascan camera and a, post-column, 2kx2k Gatan imaging filter.
Materials Characterisation
Electron/Ion Microscopy
Transmission
3D EDS capability upgrade using Gatan 3View system
Materials Characterisation
Electron/Ion Microscopy
Detectors
Advanced Chemicals and Materials Analysis Service (ACMA)
Materials Characterisation
Electron/Ion Microscopy
Scanning
Atomic force microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
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