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4Probe STM
Sample Measurement/Analysis
Cryogenic
4K
Materials Characterisation
Electron/Ion Microscopy
Scanning
Materials Characterisation
Surface Probe Microscopy
Scanning Tunneling
Materials Characterisation
Surface Probe Microscopy
Magnetic Force
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Asylum Research MFP - 3D AFM
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Asylum Research MFP- 3D AFM
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Auto 306 High Vac Evaporator
Process Equipment - Physical
Thin Film Deposition
Evaporator
Digital Oscilloscope
Sample Measurement/Analysis
Electronic
Oscilloscope
Dual FS/PS Laser System
Sample Measurement/Analysis
Laser
Femtosecond
Ellipsometer - Fixed Angle
Process Equipment - Physical
Characterisation
Ellipsometry
Ellipsometer - Variable Angle
Process Equipment - Physical
Characterisation
Ellipsometry
Direct Write Laser System
Process Equipment - Physical
Lithography
Laser (Direct-Write)
Direct Write Laser System
Process Equipment - Physical
Lithography
Laser (Direct-Write)
