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IPGPhor IEF system
Sample Measurement/Analysis
Proteins/Nucleic Acids
Electrophoresis
IPSC Facility
Process Equipment - Biological
Characterisation
Analysers
iQue Screener PLUS 220V(EU) HIGH-CONTENT CELL SCREENING SYSTEM
IR Cell and coupling
IR Spec (FT-IR)
Materials Characterisation
Spectroscopy
Infra-Red
IR/Raman Spectrometer
Materials Characterisation
Spectroscopy
Raman
IRB120 Industrial Robot&IRC5 contoller
Process Equipment - Physical
Sample Manipulation
Robot
ISCUSflex Microdialysis Analyser
Sample Measurement/Analysis
Bio-Medical
Dental
iSeq 100/BaseSpace system
Sample Measurement/Analysis
Proteins/Nucleic Acids
Sequencers
ISET System
Sample Measurement/Analysis
Electronic
Network Analyser
ISO caging and Biosafety cabinet
ISO controller
Isolera Spektra Accelerated Chromatographic Isolation system
Materials Characterisation
Chemical Analysis
Chromatography
Isostatic laminator
Process Equipment - Physical
Packaging
Encapsulation
Isostatic Press
Process Equipment - Physical
Packaging
Encapsulation
Isotope
Materials Characterisation
Spectrometry
Mass Spectrometry
Isotope
Materials Characterisation
Spectrometry
Mass Spectrometry
Isotope Analyser
Materials Characterisation
Spectrometry
Mass Spectrometry
Isotope Analyser
Materials Characterisation
Spectrometry
Mass Spectrometry
Isotope Analyser
Materials Characterisation
Spectrometry
Mass Spectrometry
ITRAX
Materials Characterisation
Spectrometry
Mass Spectrometry
Ivium potentiostat systems
Materials Characterisation
Chemical Analysis
Electrochemical
IX71 with cell^M 'Lite' System
Materials Characterisation
Optical Microscopy
Fluorescence
IXON Electron CCD
iXRD Residual Stress System
Materials Characterisation
Diffraction
X-ray
JEOL 2100F Transmission Electron Microscope
JPK Instruments Ltd : Atomic force microscope with a liquid-state electrochemical cell (ec-AFM)
Materials Characterisation
Surface Probe Microscopy
Atomic Force
JPK NanoWizard/UltraSpeed Atomic Force Microscope system
Materials Characterisation
Surface Probe Microscopy
Atomic Force
K2 Summit Counting Direct Detection Camera
Materials Characterisation
Electron/Ion Microscopy
Detectors
Keithley source meters and nanovoltmeters
Sample Measurement/Analysis
Electronic
Low Frequency Characterisation
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