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3 EMCCD CAMERA
Sample Measurement/Analysis
Optical
High Resolution Imaging
CCD CAMERA
Sample Measurement/Analysis
Optical
High Resolution Imaging
CNC Lathe
Infrastructure
Workshop
CNC Machines
Electron Beam Lithography System
FEI SIRION XL 30 ELECTRON SEM WITH EDX
HR Sputter Coater
ICCD CAMERA
Sample Measurement/Analysis
Optical
High Resolution Imaging
ICCD CAMERA 4PICOS DIG
Sample Measurement/Analysis
Optical
High Resolution Imaging
ICCD camera, DH334T-18U-C3 iStar
Sample Measurement/Analysis
Optical
High Resolution Imaging
ICCD camera, DH334T-18U-C3 iStar,
Sample Measurement/Analysis
Optical
High Resolution Imaging
ICCD Camera, DH734-18-UO3 iStar, Gen 2 Intensifier
JEOL AFM JSPM 5200
Materials Characterisation
Surface Probe Microscopy
Atomic Force
MICROSCOPE, TRANSMISSION ELECTRON
MILLING MACHINE HURCO CNC HAWK
Infrastructure
Workshop
CNC Machines
PL-2250 Nd:YAG Pumplaser 1064nm, 30 ps, 50mJ, 10Hz
Sample Measurement/Analysis
Laser
Picosecond
PRECISION ION POLISHING SYSTEM
Reactive Ion Etching System
Scanning Electron Microscope
SL312P Nd:YAG Laser System 1064 nm, 600mJ, 170ps,
Sample Measurement/Analysis
Laser
Picosecond
Sputterer
Thermal Evaporator
Transmission Electron Microscope
VIBRATING SAMPLE MAGNETOMETER
Materials Characterisation
Magnetometry
Vibrating Sample
WIRE BONDER
A system for controlled atmosphere parametric characterisation of electronic devices and circuits
Materials Characterisation
Surface analysis
Charge
Agilent Single Quadrupole LCMS
Materials Characterisation
Spectrometry
Mass Spectrometry
Annealing Furnace for Ultra Low Temperature Materials
Process Equipment - Physical
Controlled Environment
Furnace
Cary 5000 UV/VIS/NIR spectrometer
Materials Characterisation
Spectrometry
Spectrophotometry
Discover SP-D Microwave Digestion
Process Equipment - Physical
Chemical Reactor
Microwave
Eye Tracking System 1
Sample Measurement/Analysis
Bio-Medical
Optical
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