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Cryostat System
Sample Measurement/Analysis
Cryogenic
milli-Kelvin
Data Acq system/RHEED Control
Materials Characterisation
Diffraction
High Energy Electron
Dimension 3100 Nanoscope AFM
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Dual Channel Surface Plasmon Resonance
Sample Measurement/Analysis
Optical
Dual-polarisation
Electronic Network Switch 32x32
Sample Measurement/Analysis
Electronic
RF
Farfield Analight Bio 200
Sample Measurement/Analysis
Optical
Dual-polarisation
Femtosecond Pulsed Laser
Process Equipment - Physical
Etching
Laser
Femtosource Laser
Sample Measurement/Analysis
Laser
Femtosecond
High Resolution X-Ray Diffractometer
Materials Characterisation
Diffraction
X-ray
HP. Spectrum Analyser,asal1500a,
Sample Measurement/Analysis
Electronic
Network Analyser
IRB120 Industrial Robot&IRC5 contoller
Process Equipment - Physical
Sample Manipulation
Robot
Isostatic laminator
Process Equipment - Physical
Packaging
Encapsulation
Lapping and Polishing Machine, PM5C
Infrastructure
Mechanical
Hydraulic
Mask Aligner
Process Equipment - Physical
Lithography
Optical
Mask Aligner, EV610
Process Equipment - Physical
Lithography
Optical
Microwave Vector Network Analyser
Sample Measurement/Analysis
Electronic
Network Analyser
Microwave,transition Analyzer
Sample Measurement/Analysis
Electronic
Microwave
MultiClamp 700B
Network Analyser
Sample Measurement/Analysis
Electronic
Network Analyser
Network Analyser
Sample Measurement/Analysis
Electronic
Network Analyser
Olympus FV1000 System
Materials Characterisation
Optical Microscopy
Reflection
Plasma Enhanced Chemical Vapour Depositi
Process Equipment - Physical
Thin Film Deposition
Chemical Vapour Deposition
ProtoLaser
Process Equipment - Physical
Lithography
Laser (Direct-Write)
RIE Etching System
Process Equipment - Physical
Etching
Reactive Ion
RIE/PECBD
Process Equipment - Physical
Etching
Reactive Ion
S Parameter Test Set
Sample Measurement/Analysis
Electronic
Network Analyser
S Parameter Test Set
Sample Measurement/Analysis
Electronic
Network Analyser
Scanning Probe Microscope
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Scriber, S100
Process Equipment - Physical
Packaging
Dicing
Spectra Physics MaiTai
Sample Measurement/Analysis
Laser
Femtosecond
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