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Physik Instrument Picocube System
Materials Characterisation
Mechanical Properties
Tensometer
Q Sense E4
Materials Characterisation
Physical Properties
Balance
Raman Microscope System
Materials Characterisation
Spectroscopy
Raman
Renishaw 2000 Raman Microscope
Materials Characterisation
Spectroscopy
Raman
Rheology Probe
Materials Characterisation
Spectroscopy
Nuclear Magnetic Resonance
Rheometer
Materials Characterisation
Mechanical Properties
Rheometer
Spectrometer - UV/VIS
Materials Characterisation
Spectrometry
Spectrophotometry
Split Pair Cryostat
Sample Measurement/Analysis
Cryogenic
1.4K
SQUID-VSM Magnetometer
Materials Characterisation
Magnetometry
SQUID
Materials Characterisation
Magnetometry
Vibrating Sample
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Thin Film Deposition System
Process Equipment - Physical
Thin Film Deposition
Evaporator
Vacuum Furnace
Process Equipment - Physical
Controlled Environment
Furnace
Vector Network Analyser
Sample Measurement/Analysis
Electronic
Network Analyser
VT SPM
Materials Characterisation
Electron/Ion Microscopy
Scanning
Wide Angle X-Ray System
Materials Characterisation
Diffraction
X-ray
WSI RHEED System
Materials Characterisation
Diffraction
High Energy Electron
X-Ray Camera Siemans
Materials Characterisation
Diffraction
X-ray
XIOS X-Ray Camera
Materials Characterisation
Diffraction
X-ray
Explorer SPM
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Mask Aligner System
Raman Imaging Microscope
Materials Characterisation
Spectroscopy
Raman
Upgrade E-Gun
Process Equipment - Physical
Thin Film Deposition
Molecular Beam Epitaxy
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